Conductive silicon probe with visible tip apex for contact mode electrical measurements.
Each pack contains 10 probes.This product is not in stock but you can order it and it will take around two weeks to get delivered. , Force Maps, Contact Mode, Scanning Tunneling Microscopy (STM), Tapping Mode, Force Curves, AM-FM Viscoelastic Mapping, Higher Eigenmode Tapping, Contact Resonance Viscoelastic Mapping, Time Dependent Dielectric Breakdown (TDDB), Video-Rate AFM, Thermal Mechanical Nanoindentation (TMNI), Fast Force Mapping (FFM), Nanolithography, Scanning Thermal Microscopy (SThM), Electrochemical Strain Microscopy (ESM), Piezoresponse Force Microscopy (PFM), Force Modulation, Loss Tangent Imaging, Fast Current Mapping, Conductive AFM (CAFM), Scanning Capacitance Mode (SCM), Electrostatic Force Microscopy (EFM), Magnetic Force Microscopy (MFM), Bimodal Dual AC, Electrochemical AFM (EC-AFM), Lateral Force Microscopy (LFM), Kelvin Probe Force Microscopy (KPFM)- Search by ModeMICROSCOPY SUPPLIES">
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