Conductive silicon probe with visible tip apex for contact mode electrical measurements.
Each pack contains 10 probes.This product is not in stock but you can order it and it will take around two weeks to get delivered. , Fast Force Mapping (FFM), Contact Mode, Lateral Force Microscopy (LFM), Scanning Thermal Microscopy (SThM), Conductive AFM (CAFM), Contact Resonance Viscoelastic Mapping, Thermal Mechanical Nanoindentation (TMNI), Video-Rate AFM, Electrochemical AFM (EC-AFM), Electrochemical Strain Microscopy (ESM), AM-FM Viscoelastic Mapping, Piezoresponse Force Microscopy (PFM), Force Maps, Magnetic Force Microscopy (MFM), Force Modulation, Nanolithography, Bimodal Dual AC, Scanning Tunneling Microscopy (STM), Electrostatic Force Microscopy (EFM), Tapping Mode, Force Curves - Contact, Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Mode (SCM), Time Dependent Dielectric Breakdown (TDDB), Fast Current Mapping, Higher Eigenmode Tapping, Loss Tangent Imaging- Search by ModeMICROSCOPY SUPPLIES ">
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