SEM Specimen Stubs, 12.5mm dia, 45deg chamfer (Pack of 10)

51-1625-0140
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
$ 24.00
In Stock 11

Description

SEM Specimen Stubs, 12.5mm dia, 45deg chamfer PK10

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