Conductive silicon probe with visible tip apex for contact mode electrical measurements.
Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
, Bimodal Dual AC, Scanning Tunneling Microscopy (STM), Nanolithography, Contact Resonance Viscoelastic Mapping, Thermal Mechanical Nanoindentation (TMNI), Scanning Thermal Microscopy (SThM), Kelvin Probe Force Microscopy (KPFM), Conductive AFM (CAFM), Time Dependent Dielectric Breakdown (TDDB), Force Curves - Contact, Electrochemical Strain Microscopy (ESM), Scanning Capacitance Mode (SCM), Piezoresponse Force Microscopy (PFM), AM-FM Viscoelastic Mapping, Force Maps, Lateral Force Microscopy (LFM), Tapping Mode, Video-Rate AFM, Electrostatic Force Microscopy (EFM), Higher Eigenmode Tapping, Loss Tangent Imaging, Fast Force Mapping (FFM), Fast Current Mapping, Electrochemical AFM (EC-AFM), Force Modulation, Contact Mode, Magnetic Force Microscopy (MFM)- Search by ModeMICROSCOPY SUPPLIES ">