Conductive silicon probe with visible tip apex for contact mode electrical measurements.
Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
, Loss Tangent Imaging, Fast Force Mapping (FFM), Conductive AFM (CAFM), Scanning Tunneling Microscopy (STM), Nanolithography, Kelvin Probe Force Microscopy (KPFM), Contact Mode, Video-Rate AFM, Force Modulation, Lateral Force Microscopy (LFM), Tapping Mode, Scanning Capacitance Mode (SCM), Electrostatic Force Microscopy (EFM), AM-FM Viscoelastic Mapping, Contact Resonance Viscoelastic Mapping, Bimodal Dual AC, Time Dependent Dielectric Breakdown (TDDB), Scanning Thermal Microscopy (SThM), Force Curves - Contact, Higher Eigenmode Tapping, Force Maps, Piezoresponse Force Microscopy (PFM), Fast Current Mapping, Magnetic Force Microscopy (MFM), Thermal Mechanical Nanoindentation (TMNI), Electrochemical AFM (EC-AFM), Electrochemical Strain Microscopy (ESM)- Search by ModeMICROSCOPY SUPPLIES ">