Conductive silicon probe with visible tip apex for contact mode electrical measurements.
Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
, Scanning Tunneling Microscopy (STM), Electrochemical Strain Microscopy (ESM), Time Dependent Dielectric Breakdown (TDDB), Force Curves, Force Modulation, Video-Rate AFM, Electrochemical AFM (EC-AFM), Fast Force Mapping (FFM), Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Mode (SCM), Higher Eigenmode Tapping, Piezoresponse Force Microscopy (PFM), Magnetic Force Microscopy (MFM), Loss Tangent Imaging, Thermal Mechanical Nanoindentation (TMNI), Bimodal Dual AC, Tapping Mode, Conductive AFM (CAFM), Scanning Thermal Microscopy (SThM), AM-FM Viscoelastic Mapping, Contact Mode, Nanolithography, Lateral Force Microscopy (LFM), Contact Resonance Viscoelastic Mapping, Fast Current Mapping, Force Maps- Search by ModeMICROSCOPY SUPPLIES">